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Applied Spectroscopy|March 12, 2015
Determination of copper and zinc pollutants in Ludwigia prostrata Roxb using near-infrared reflectance spectroscopy (NIRS)Aiguo Ouyang, Lixia Jiang, Yande Liu, et al.Applied Spectroscopy|August 9, 2020
Lithium Isotope Measurement Using Laser-Induced Breakdown Spectroscopy and ChemometricsJason C Wood, Michael B ShattanApplied Spectroscopy|April 19, 2023
Dual-Band Infrared Scheimpflug Lidar Reveals Insect Activity in a Tropical Cloud ForestVictor Santos, Cesar Costa-Vera, Pamela Rivera-Parra, et al.Applied Spectroscopy|May 19, 2023
Identification of Glucose-6 Phosphate Dehydrogenase Deficient Patients Using Attenuated Total Reflection Fourier Transform Infrared Spectroscopy Using Partial Least Squares Discriminant Analysis in Aqueous Blood SamplesMiguela Martin, Molin Wongwattanakul, Noppmats Khemtonglang, et al.Applied Spectroscopy|July 3, 2020
Detecting Minerals and Organics Relevant to Planetary Exploration Using a Compact Portable Remote Raman System at 122 MetersMacey W Sandford, Anupam K Misra, Tayro E Acosta-Maeda, et al.Applied Spectroscopy|July 7, 2020
Interactions Between Epitaxial Graphene Grown on the Si- and C-Faces of 4H-SiC Investigated Using Raman Imaging and Tip-Enhanced Raman ScatteringShohei Uemura, Sanpon Vantasin, Yasutaka Kitahama, et al.Applied Spectroscopy|March 6, 2015
Optical Emission Studies of Copper Plasma Induced Using Infrared Transversely Excited Atmospheric (IR TEA) Carbon Dioxide Laser PulsesMilos Momcilovic, Miroslav Kuzmanovic, Dragan Rankovic, et al.Applied Spectroscopy|March 6, 2015
Co-Deposition of Gold Nanoparticles and Metalloporphyrin Using the Langmuir-Blodgett (LB) Technique for Surface-Enhanced Raman Scattering (SERS)Sabrina A Camacho, Pedro H B Aoki, Francisco F de Assis, et al.Applied Spectroscopy|March 6, 2015
Spatial filtering of a diode laser beam for confocal Raman microscopyJay P Kitt, David A Bryce, Joel M HarrisApplied Spectroscopy|March 6, 2015
Optical Absorption Microspectroscopy (μ-OAS) Based on Schwarzschild-Type Cassegrain OpticsMathieu Chassé, Gérald Lelong, Peter van Nijnatten, et al.Pageof 393