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Applied Spectroscopy|March 25, 2026
EXPRESS: Data Adequacy Testing for Partial Least Squares Discriminant Analysis Using Raman SpectraH Georg Schulze, Rupa Haldavekar, Shreyas Rangan, et al.
Applied Spectroscopy|May 16, 2026
Biological and Biomedical Applications of Optical Photothermal Infrared Spectroscopy (O-PTIR)Twinkle Soni, Diana E Bedolla, Bayden R Wood
Applied Spectroscopy|May 19, 2026
EXPRESS: Micro-Raman Spectroscopy, X-ray Fluorescence, and X-ray Diffraction Analysis of Materials, Stratigraphy, Hidden Inscriptions, and Artistic Techniques in Portrait of Farrokh GaffariHongyan Sun, Fang Wang, Xin Wang, et al.
Applied Spectroscopy|May 19, 2026
Silica Nanoparticle and Microwave Plasma Torch Effects on Laser-Induced Breakdown SpectroscopyChen Yang, Zhihang Lai, Shujia Wu, et al.
Applied Spectroscopy|April 25, 2026
Spectral Similarity Analysis of Camphor-10-Sulphonic Acid: A System Suitability Standard for Circular Dichroism in Quality Regulated EnvironmentsChristopher Jones
Applied Spectroscopy|May 26, 2026
EXPRESS: Quantitative Diagnostics of Hydroxyl (OH) Radicals in Methane-Air Flames Using Wavelength Modulation Spectroscopy with Correction for Water Spectral InterferenceJiyeon Park, Aran Song, Changkook Ryu, et al.
Applied Spectroscopy|May 21, 2026
Simple Estimation of Errors and Multi-Pixel Signal-to-Noise Ratio for Gaussian, Lorentzian, and Pseudo-Voigt functions Fit to Noisy Spectral DataRyan S Jakubek, Rohit Bhartia, Marc D Fries
Applied Spectroscopy|October 26, 2007
Spectroscopic investigations on the depth-dependent degradation gradients of aged triterpenoid varnishesCharis Theodorakopoulos, Vassilis Zafiropulos, Jaap J Boon, et al.
Applied Spectroscopy|November 13, 2003
Near-infrared spectroscopy: a tool for monitoring submerged fermentation processes using an immersion optical-fiber probeE Tamburini, G Vaccari, S Tosi, et al.
Applied Spectroscopy|May 7, 2013
Abnormal behavior of longitudinal optical phonon in silicon dioxide films on 4H-SiC bulk epitaxial substrate using Fourier transform infrared (FT-IR) spectroscopyMasanobu Yoshikawa, Hirohumi Seki, Tsuneyuki Yamane, et al.
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