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Applied Spectroscopy|December 9, 2003
Study of fitting algorithms applied to simultaneous analysis of large numbers of peaks in gamma-ray spectraM Morhác, J Kliman, M Jandel, et al.Applied Spectroscopy|December 9, 2003
Exploitation of FRiedel-Crafts acylation as a color derivatizing reaction for terpene and lipids analysesJoe Studer, Neil Purdie, Justin KrouseApplied Spectroscopy|December 9, 2003
Sol-gel-coated mid-infrared fiber-optic sensorsMarkus Janotta, Abraham Katzir, Boris MizaikoffApplied Spectroscopy|December 9, 2003
FT-IR study of a chemically amplified resist for X-ray lithographyT L Tan, V A Kudryashov, B L TanApplied Spectroscopy|December 9, 2003
Spectral code index (SPECOIND): a general infrared spectral database search methodJian Feng Li, Bo Tao Fan, Jean-Pierre Doucet, et al.Applied Spectroscopy|December 9, 2003
Surface-sensitive molecular information on polymers from UV-resonance Raman spectroscopyJiann-Hua Wang, David Klenerman, André van der Pol, et al.Applied Spectroscopy|December 9, 2003
Self-referencing intensity measurements based on square-wave gated phase-modulation fluorimetryH M Rowe, Sing Po Chan, J N Demas, et al.Applied Spectroscopy|December 9, 2003
Diffusional fluorescence quenching of aromatic hydrocarbonsClelia Canuel, Sophie Badre, Henning Groenzin, et al.Applied Spectroscopy|December 9, 2003
Application of partial least-squares regression to near-infrared reflectance spectroscopic determination of shive content in flaxMiryeong Sohn, Franklin E Barton, Wiley H Morrison, et al.Applied Spectroscopy|December 9, 2003
Error analysis for estimation of trace vapor concentration pathlength in stack plumesNeal B Gallagher, Barry M Wise, David M SheenPageof 397