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Applied Spectroscopy|December 9, 2003
Interaction between a capacitor electrolyte and gamma-aluminum oxide studied by Fourier transform infrared spectroscopyIldikó Száraz, Willis ForslingApplied Spectroscopy|January 20, 2004
Broadband light profile microscopy: a rapid and direct method for thin film depth imagingS W Fu, J F PowerApplied Spectroscopy|January 20, 2004
Silver-coated zeolite crystal films as surface-enhanced Raman scattering substratesWenfu Yan, Lili Bao, Shannon M Mahurin, et al.Applied Spectroscopy|January 20, 2004
Spectra and concentration profiles throughout the reaction of curing epoxy resins from near-infrared spectroscopy and multivariate curve resolution methodsM S Larrechi, F X RiusApplied Spectroscopy|January 20, 2004
Multiway calibration for creatinine determination in human serum using the Jaffé reactionMarcos V Guterres, Pedro O L Volpe, Márcia M C FerreiraApplied Spectroscopy|December 23, 2003
Trace analysis of rubidium hyperfine structure in a flame atomizer using sub-Doppler laser wave-mixing spectroscopyKenneth M Weed, William G TongApplied Spectroscopy|December 23, 2003
Automated line-focused laser ablation for mapping of inclusions in stainless steelM P Mateo, L M Cabalín, J J LasernaApplied Spectroscopy|December 23, 2003
Orientation effects in waveguide resonance Raman spectroscopy of monolayersJ S Kanger, C OttoApplied Spectroscopy|December 23, 2003
Spectral depth profiling of arbitrary surfaces by thermal emission decay-Fourier transform infrared spectroscopyIoan Notingher, Robert E Imhof, Peng Xiao, et al.Applied Spectroscopy|December 23, 2003
Infrared reflection spectroscopy of thin films on highly oriented pyrolytic graphiteThomas Leitner, Jürgen Kattner, Helmuth HoffmannPageof 397