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Beilstein Journal of Nanotechnology|December 6, 2012
Revealing thermal effects in the electronic transport through irradiated atomic metal point contactsBastian Kopp, Zhiwei Yi, Daniel Benner, et al.
Beilstein Journal of Nanotechnology|December 6, 2012
Growth behaviour and mechanical properties of PLL/HA multilayer films studied by AFMCagri Uzüm, Johannes Hellwig, Narayanan Madaboosi, et al.
Beilstein Journal of Nanotechnology|February 1, 2013
Pure hydrogen low-temperature plasma exposure of HOPG and graphene: Graphane formation?Baran Eren, Dorothée Hug, Laurent Marot, et al.
Beilstein Journal of Nanotechnology|February 1, 2013
Diamond nanophotonicsKatja Beha, Helmut Fedder, Marco Wolfer, et al.
Beilstein Journal of Nanotechnology|February 13, 2013
Nanostructure-directed chemical sensing: The IHSAB principle and the dynamics of acid/base-interface interactionJames L Gole, William Laminack
Beilstein Journal of Nanotechnology|February 13, 2013
Calculation of the effect of tip geometry on noncontact atomic force microscopy using a qPlus sensorJulian Stirling, Gordon A Shaw
Beilstein Journal of Nanotechnology|February 13, 2013
Interpreting motion and force for narrow-band intermodulation atomic force microscopyDaniel Platz, Daniel Forchheimer, Erik A Tholén, et al.
Beilstein Journal of Nanotechnology|February 13, 2013
Effect of normal load and roughness on the nanoscale friction coefficient in the elastic and plastic contact regimeAditya Kumar, Thorsten Staedler, Xin Jiang
Beilstein Journal of Nanotechnology|March 20, 2012
Effect of the tip state during qPlus noncontact atomic force microscopy of Si(100) at 5 K: Probing the probeAdam Sweetman, Sam Jarvis, Rosanna Danza, et al.
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