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Beilstein Journal of Nanotechnology|February 13, 2013
Characterization of the mechanical properties of qPlus sensorsJan Berger, Martin Svec, Martin Müller, et al.
Beilstein Journal of Nanotechnology|February 13, 2013
Controlled deposition and combing of DNA across lithographically defined patterns on siliconZeinab Esmail Nazari, Leonid Gurevich
Beilstein Journal of Nanotechnology|February 1, 2013
Current-voltage characteristics of single-molecule diarylethene junctions measured with adjustable gold electrodes in solutionBernd M Briechle, Youngsang Kim, Philipp Ehrenreich, et al.
Beilstein Journal of Nanotechnology|February 1, 2013
Spring constant of a tuning-fork sensor for dynamic force microscopyDennis van Vörden, Manfred Lange, Merlin Schmuck, et al.
Beilstein Journal of Nanotechnology|February 1, 2013
Pinch-off mechanism in double-lateral-gate junctionless transistors fabricated by scanning probe microscope based lithographyFarhad Larki, Arash Dehzangi, Alam Abedini, et al.
Beilstein Journal of Nanotechnology|February 1, 2013
Reversible mechano-electrochemical writing of metallic nanostructures with the tip of an atomic force microscopeChristian Obermair, Marina Kress, Andreas Wagner, et al.
Beilstein Journal of Nanotechnology|February 1, 2013
Tuning the properties of magnetic thin films by interaction with periodic nanostructuresUlf Wiedwald, Felix Haering, Stefan Nau, et al.
Beilstein Journal of Nanotechnology|February 1, 2013
Structural and electronic properties of oligo- and polythiophenes modified by substituentsSimon P Rittmeyer, Axel Groß
Beilstein Journal of Nanotechnology|December 6, 2012
Plasmonics-based detection of H(2) and CO: discrimination between reducing gases facilitated by material controlGnanaprakash Dharmalingam, Nicholas A Joy, Benjamin Grisafe, et al.
Beilstein Journal of Nanotechnology|December 6, 2012
The memory effect of nanoscale memristors investigated by conducting scanning probe microscopy methodsCésar Moreno, Carmen Munuera, Xavier Obradors, et al.
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