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Beilstein Journal of Nanotechnology|September 22, 2023
Prediction of cytotoxicity of heavy metals adsorbed on nano-TiO2 with periodic table descriptors using machine learning approachesJoyita Roy, Souvik Pore, Kunal Roy
Beilstein Journal of Nanotechnology|September 22, 2023
Upscaling the urea method synthesis of CoAl layered double hydroxidesCamilo Jaramillo-Hernández, Víctor Oestreicher, Martín Mizrahi, et al.
Beilstein Journal of Nanotechnology|July 13, 2023
Silver nanoparticles loaded on lactose/alginate: in situ synthesis, catalytic degradation, and pH-dependent antibacterial activityNguyen Thi Thanh Tu, T Lan-Anh Vo, T Thu-Trang Ho, et al.
Beilstein Journal of Nanotechnology|July 5, 2023
Carboxylic acids and light interact to affect nanoceria stability and dissolution in acidic aqueous environmentsMatthew L Hancock, Eric A Grulke, Robert A Yokel
Beilstein Journal of Nanotechnology|June 22, 2023
Current-induced mechanical torque in chiral molecular rotorsRichard Korytár, Ferdinand Evers
Beilstein Journal of Nanotechnology|June 22, 2023
Cross-sectional Kelvin probe force microscopy on III-V epitaxial multilayer stacks: challenges and perspectivesMattia da Lisca, José Alvarez, James P Connolly, et al.
Beilstein Journal of Nanotechnology|January 26, 2019
A comparison of tarsal morphology and traction force in the two burying beetles Nicrophorus nepalensis and Nicrophorus vespilloides (Coleoptera, Silphidae)Liesa Schnee, Benjamin Sampalla, Josef K Müller, et al.
Beilstein Journal of Nanotechnology|January 26, 2019
Pull-off and friction forces of micropatterned elastomers on soft substrates: the effects of pattern length scale and stiffnessPeter van Assenbergh, Marike Fokker, Julian Langowski, et al.
Beilstein Journal of Nanotechnology|January 26, 2019
Wet chemistry route for the decoration of carbon nanotubes with iron oxide nanoparticles for gas sensingHussam M Elnabawy, Juan Casanova-Chafer, Badawi Anis, et al.
Beilstein Journal of Nanotechnology|September 25, 2020
Atomic defect classification of the H-Si(100) surface through multi-mode scanning probe microscopyJeremiah Croshaw, Thomas Dienel, Taleana Huff, et al.
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