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Biometrical Journal. Biometrische Zeitschrift|January 25, 2011
Augmented p-rep designsEmlyn Williams, Hans-Peter Piepho, David Whitaker
Biometrical Journal. Biometrische Zeitschrift|January 25, 2011
Quantifying the impact of fixed effects modeling of clusters in multiple imputation for cluster randomized trialsRebecca R Andridge
Biometrical Journal. Biometrische Zeitschrift|June 18, 2011
Bayesian analysis of non-linear differential equation models with application to a gut microbial ecosystemDaniel J Lawson, Grietje Holtrop, Harry Flint
Biometrical Journal. Biometrische Zeitschrift|November 6, 2007
Testing concordance of clinical characteristics in familial studies with application to inflammatory bowel diseasesJun Yan, Cyrus P Tamboli
Biometrical Journal. Biometrische Zeitschrift|September 1, 2007
A parametric comparison of diagnostic accuracy with three ordinal diagnostic groupsChengjie Xiong, Gerald van Belle, J Philip Miller, et al.
Biometrical Journal. Biometrische Zeitschrift|January 7, 2012
ROC curve inference for best linear combination of two biomarkers subject to limits of detectionNeil J Perkins, Enrique F Schisterman, Albert Vexler
Biometrical Journal. Biometrische Zeitschrift|January 7, 2012
Analysis of covariance with pre-treatment measurements in randomized trials under the cases that covariances and post-treatment variances differ between groupsTakashi Funatogawa, Ikuko Funatogawa, Yu Shyr
Biometrical Journal. Biometrische Zeitschrift|December 16, 2011
A new proposal for a principal component-based test for high-dimensional data applied to the analysis of PhyloChip dataGuo-Chun Ding, Kornelia Smalla, Holger Heuer, et al.
Biometrical Journal. Biometrische Zeitschrift|April 24, 2012
Testing Markovianity in the three-state progressive model via future-past associationMar Rodríguez-Girondo, Jacobo de Uña-Álvarez
Biometrical Journal. Biometrische Zeitschrift|August 13, 2011
Graphical approaches for multiple comparison procedures using weighted Bonferroni, Simes, or parametric testsFrank Bretz, Martin Posch, Ekkehard Glimm, et al.
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