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IEEE Transactions on Pattern Analysis and Machine Intelligence|February 3, 2026
Generalized Regularized Evidential Deep Learning Models: Theory and Comprehensive EvaluationDeep Shankar Pandey, Hyomin Choi, Qi Yu
IEEE Transactions on Pattern Analysis and Machine Intelligence|February 13, 2026
Enhancing Adversarial Transferability with Cost-efficient Landscape FlatteningZhipeng Wei, Jingjing Chen, Feng Han, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|February 13, 2026
Distribution-to-Points Matching for Image Text RetrievalZheng Wang, Xing Xu, Lei Zhu, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|January 29, 2026
Deeply Learned Robust Matrix Completion for Large-scale Low-rank Data RecoveryHanQin Cai, Chandra Kundu, Jialin Liu, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|January 29, 2026
Tackling Ill-Posedness of Reversible Image Conversion With Well-Posed Invertible NetworkYuanfei Huang, Hua Huang
IEEE Transactions on Pattern Analysis and Machine Intelligence|January 28, 2026
Vocabulary-free Image Classification and Semantic SegmentationAlessandro Conti, Enrico Fini, Massimiliano Mancini, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|February 11, 2026
Exploring and Tailoring the Test-Time Augmentation for Sequential RecommendationYizhou Dang, Enneng Yang, Yuting Liu, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|February 6, 2026
ASIL: Augmented Structural Information Learning for Deep Graph Clustering in Hyperbolic SpaceLi Sun, Zhenhao Huang, Yujie Wang, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|January 29, 2026
Privacy-Preserving Model Transcription With Differentially Private Synthetic DistillationBochao Liu, Shiming Ge, Pengju Wang, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|January 29, 2026
SEGA: A Transferable Signed Ensemble Gaussian Black-Box Attack Against No-Reference Image Quality Assessment ModelsYujia Liu, Dingquan Li, Zhixuan Li, et al.
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