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IEEE Transactions on Pattern Analysis and Machine Intelligence|August 27, 2011
Bayesian and decision tree approaches for pattern recognition including feature measurement costsG R Dattatreya, V V SarmaIEEE Transactions on Pattern Analysis and Machine Intelligence|August 27, 2011
A three-dimensional edge operatorS W Zucker, R A HummelIEEE Transactions on Pattern Analysis and Machine Intelligence|August 27, 2011
Evaluation of image fidelity by means of the fidelogram and level mean-square errorH Katsulai, N ArimizuIEEE Transactions on Pattern Analysis and Machine Intelligence|August 27, 2011
Reliable indexing using unreliable recognition devicesJ K MullinIEEE Transactions on Pattern Analysis and Machine Intelligence|August 27, 2011
Shape segmentation using relaxationW S Rutkowski, S Peleg, A RosenfeldIEEE Transactions on Pattern Analysis and Machine Intelligence|August 27, 2011
Some mathematical and representational aspects of solid modelingC M BrownIEEE Transactions on Pattern Analysis and Machine Intelligence|August 27, 2011
ANDAL: A Nonparametric Discrimination And Learning Algorithm for Recognition in Imperfectly Supervised EnvironmentsB V Sheela, B V DasarathyIEEE Transactions on Pattern Analysis and Machine Intelligence|August 27, 2011
An optimal line following algorithmL MeroIEEE Transactions on Pattern Analysis and Machine Intelligence|August 27, 2011
Real-time adaptive contrast enhancementP M Narendra, R C FitchIEEE Transactions on Pattern Analysis and Machine Intelligence|August 27, 2011
A simple contour matching algorithmT W Sze, Y H YangPageof 870