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IEEE Transactions on Pattern Analysis and Machine Intelligence|July 12, 2018
EAC-Net: Deep Nets with Enhancing and Cropping for Facial Action Unit DetectionWei Li, Farnaz Abtahi, Zhigang Zhu, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|July 12, 2018
Differential Geometry in Edge Detection: Accurate Estimation of Position, Orientation and CurvatureBenjamin B Kimia, Xiaoyan Li, Yuliang Guo, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|July 12, 2018
Salient Object Detection with Recurrent Fully Convolutional NetworksLinzhao Wang, Lijun Wang, Huchuan Lu, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|July 12, 2018
Ordinal Constraint Binary Coding for Approximate Nearest Neighbor SearchHong Liu, Rongrong Ji, Jingdong Wang, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|July 12, 2018
CNN-Based Real-Time Dense Face Reconstruction with Inverse-Rendered Photo-Realistic Face ImagesYudong Guo, Juyong Zhang, Jianfei Cai, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|July 12, 2018
Monocular Depth Estimation Using Multi-Scale Continuous CRFs as Sequential Deep NetworksDan Xu, Elisa Ricci, Wanli Ouyang, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|July 12, 2018
Pólya Urn Latent Dirichlet Allocation: A Doubly Sparse Massively Parallel SamplerAlexander Terenin, Mans Magnusson, Leif Jonsson, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|July 12, 2018
Unifying Visual Attribute Learning with Object Recognition in a Multiplicative FrameworkKongming Liang, Hong Chang, Bingpeng Ma, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|July 12, 2018
Distance Encoded Product Quantization for Approximate K-Nearest Neighbor Search in High-Dimensional SpaceJae-Pil Heo, Zhe Lin, Sung-Eui Yoon
IEEE Transactions on Pattern Analysis and Machine Intelligence|July 12, 2018
Deep Metric Learning with BIER: Boosting Independent Embeddings RobustlyMichael Opitz, Georg Waltner, Horst Possegger, et al.
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