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IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control|September 23, 2011
Dielectric and piezoelectric properties in the lead-free system Na0.5K0.5NbO3-BiScO3-LiTaO3Fangyuan Zhu, Michael B Ward, Tim P Comyn, et al.
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control|September 23, 2011
Effect of material constants on power output in piezoelectric vibration-based generatorsHiroaki Takeda, Kensuke Mihara, Tomohiro Yoshimura, et al.
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control|September 23, 2011
Dielectric characterization of (1-x)PMN-xPT (x = 0.07 and 0.10) ceramics synthesized by an ethylene glycol-based soft chemical routeHamel N Tailor, Alexei A Bokov, Zuo-Guang Ye
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control|May 31, 2011
Phase coherence imaging of grained materialsJorge Camacho, Carlos Fritsch
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control|May 31, 2011
An analytical model for guided wave inspection optimization for prismatic structures of any cross sectionRuth M Sanderson, Philip P Catton
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control|May 31, 2011
Perfectly matched layers for frequency-domain integral equation acoustic scattering problemsErwin J Alles, Koen W A van Dongen
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control|May 31, 2011
Verification of the Westervelt equation for focused transducersYun Jing, Du Shen, Greg T Clement
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control|November 9, 2016
Ultrasound Vector Flow Imaging-Part II: Parallel SystemsJorgen Arendt Jensen, Svetoslav Ivanov Nikolov, Alfred C H Yu, et al.
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control|November 9, 2016
The Effect of Boundary Conditions on Resonant Ultrasonic Spherical ChainsO Akanji, Jia Yang, David Hutchins, et al.
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control|January 7, 2017
Comparison of the Thermal Degradation of Heavily Nb-Doped and Normal PZT Thin FilmsJeong-Suong Yang, YunSung Kang, Inyoung Kang, et al.
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