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Iucrj|December 22, 2023
Orientational analysis of atomic pair correlations in nanocrystalline indium oxide thin filmsJustin M Hoffman, Niklas B Thompson, Olaf Borkiewicz, et al.
Iucrj|November 11, 2017
Crystal engineering: structure, property and beyondGautam R Desiraju
Iucrj|March 24, 2016
Real-time direct and diffraction X-ray imaging of irregular silicon wafer breakageAlexander Rack, Mario Scheel, Andreas N Danilewsky
Iucrj|July 16, 2015
Application of synchrotron through-the-substrate microdiffraction to crystals in polished thin sectionsJordi Rius, Oriol Vallcorba, Carlos Frontera, et al.
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