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Journal of X-Ray Science and Technology|February 11, 2011
Scanning interferometer for the measurement of anomalous dispersion with synchrotron x raysU Bonse, H Lotsch, A HenningJournal of X-Ray Science and Technology|February 11, 2011
Influence of exposure time on the sensitivity of kodak 101 x-ray filmH Nishimura, K Eidmann, K Sugimoto, et al.Journal of X-Ray Science and Technology|February 11, 2011
Diffraction effects in grazing incidence x-ray telescopesJ E HarveyJournal of X-Ray Science and Technology|February 11, 2011
Structure of nickel layers in ni-C multilayer coatings: influence of annealingG E van Dorssen, E J Puik, M J van der Wiel, et al.Journal of X-Ray Science and Technology|February 11, 2011
Synchrotron radiation white beam topography with an oscillating monochromatorW Graeff, K WieteskaJournal of X-Ray Science and Technology|February 11, 2011
Ultrashort ultraviolet free-electron lasersD Umstadter, L H Yu, E Johnson, et al.Journal of X-Ray Science and Technology|February 11, 2011
Optical analysis of an ultra-high resolution two-mirror soft x-ray microscopeD L Shealy, C Wang, R B HooverJournal of X-Ray Science and Technology|February 11, 2011
Soft x-ray instrumentation and its applications at the advanced photon sourceE Gluskin, K J Randall, I McNulty, et al.Journal of X-Ray Science and Technology|February 11, 2011
The use of soft x rays to study the ultrastructure of living biological materialA D Stead, R A Cotton, J G Duckett, et al.Journal of X-Ray Science and Technology|February 11, 2011
Microstructural and chemical characterization of the inconel/ti(n) thin film and multilayer systemP E Diehl, H K Pew, D W Madsen, et al.Pageof 138