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Journal of Applied Crystallography|August 6, 2025
A systematic approach for quantitative orientation and phase fraction analysis of thin films through grazing-incidence X-ray diffractionFabian Gasser, Sanjay John, Jorid Smets, et al.Journal of Applied Crystallography|August 6, 2025
Powder diffraction data beyond the pattern: a practical reviewNicola Casati, Elena BoldyrevaJournal of Applied Crystallography|August 6, 2025
Oblique diffraction geometry for the observation of several non-coplanar Bragg reflections under identical illuminationCarsten Detlefs, Axel Henningsson, Brinthan Kanesalingam, et al.Journal of Applied Crystallography|August 6, 2025
Comparison of time-of-flight and MIEZE neutron spectroscopy of H2OLukas Beddrich, Johanna K Jochum, Philipp Bender, et al.Journal of Applied Crystallography|August 6, 2025
A model for out-of-phase boundary induced X-ray diffraction peak profile changes in Aurivillius oxide thin filmsRoger W Whatmore, Debismita Dutta, Lynette KeeneyJournal of Applied Crystallography|February 6, 2026
Evolution of crystallographic texture and material anisotropy effects resulting from uniaxial deformation for high-strength steels with high manganese contentMichael Zuern, Morteza Dadkhah, Thomas Nitschke-Pagel, et al.Journal of Applied Crystallography|February 6, 2026
Scattering from 'Babinet' particles (or not…): spherical particles made up of spheres and spherical particles with spherical voidsJan Skov Pedersen, Thea Lykkegaard Møller, Milena CorredigJournal of Applied Crystallography|December 19, 2024
Maximally efficient exchange in thin flow cells using density gradientsMegan E Mitchell, Charles F Majkrzak, David P HoogerheideJournal of Applied Crystallography|February 7, 2025
Error evaluation of partial scattering functions obtained from contrast-variation small-angle neutron scatteringKoichi Mayumi, Tatsuro Oda, Shinya Miyajima, et al.Journal of Applied Crystallography|February 7, 2025
Characterization and calibration of DECTRIS PILATUS3 X CdTe 2M high-Z hybrid pixel detector for high-precision powder diffraction measurementsGavin B M Vaughan, Stefano Checchia, Marco Di MichielPageof 112