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Journal of Applied Crystallography|January 19, 2026
Room-temperature structure determination of vacuum-sensitive organic compounds by formvar encapsulation and serial electron diffractionSreelaja Pulleri Vadhyar, Ehsan Nikbin, Hazem Daoud, et al.Journal of Applied Crystallography|January 19, 2026
Assessing the problem of excitation light scattering in high-viscosity jets used in serial crystallography sample deliveryStanisław Niziński, Bogdan Marekha, Jochen Reinstein, et al.Journal of Applied Crystallography|January 19, 2026
Automated and real-time structure solution using 3D electron diffractionYi Luo, Yuwei Deng, Bin Wang, et al.Journal of Applied Crystallography|January 19, 2026
Quantifying interflake ordering in graphene oxide films via wide-angle X-ray scattering analysisRoque Sanchez Salas, Aaron Morelos Gomez, David Angel Sanchez Hernandez, et al.Journal of Applied Crystallography|January 19, 2026
Sample environment for simultaneous quasi-elastic neutron scattering and Raman spectroscopy experiments demonstrated on polymer films under changing humidity and temperatureLucas P Kreuzer, Marcell Wolf, Friederike Ganster, et al.Journal of Applied Crystallography|February 13, 2023
Aspherical atom refinements on X-ray data of diverse structures including disordered and covalent organic framework systems: a time-accuracy trade-offKunal Kumar Jha, Florian Kleemiss, Michał Leszek Chodkiewicz, et al.Journal of Applied Crystallography|February 13, 2023
Kinematic scattering by nanocrystalsOlivier Thomas, Ismail Cevdet NoyanJournal of Applied Crystallography|February 13, 2023
Specimen-displacement correction for powder X-ray diffraction in Debye-Scherrer geometry with a flat area detectorBenjamin S Hulbert, Waltraud M KrivenJournal of Applied Crystallography|February 13, 2023
Machine learning for scattering data: strategies, perspectives and applications to surface scatteringAlexander Hinderhofer, Alessandro Greco, Vladimir Starostin, et al.Journal of Applied Crystallography|February 13, 2023
HAT: a high-energy surface X-ray diffraction analysis toolkitGary S Harlow, Sebastian Pfaff, Giuseppe Abbondanza, et al.Pageof 112