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Journal of Applied Crystallography|April 10, 2024
Neural network analysis of neutron and X-ray reflectivity data incorporating prior knowledgeValentin Munteanu, Vladimir Starostin, Alessandro Greco, et al.Journal of Applied Crystallography|April 10, 2024
INSIGHT: in situ heuristic tool for the efficient reduction of grazing-incidence X-ray scattering dataManuel A Reus, Lennart K Reb, David P Kosbahn, et al.Journal of Applied Crystallography|April 10, 2024
DLSIA: Deep Learning for Scientific Image AnalysisEric J Roberts, Tanny Chavez, Alexander Hexemer, et al.Journal of Applied Crystallography|April 10, 2024
X-ray standing wave characterization of the strong metal-support interaction in Co/TiO model catalystsAtul Tiwari, Matteo Monai, Ksenia Matveevskii, et al.Journal of Applied Crystallography|April 10, 2024
FlɛX: a computer vision program to evaluate strain in flexible crystalsBenjamin Hsieh, Lai-Chin Wu, Arnaud GrosjeanJournal of Applied Crystallography|April 10, 2024
The Pixel Anomaly Detection Tool: a user-friendly GUI for classifying detector frames using machine-learning approachesGihan Ketawala, Caitlin M Reiter, Petra Fromme, et al.Journal of Applied Crystallography|April 10, 2024
X-Ray Calc 3: improved software for simulation and inverse problem solving for X-ray reflectivityOleksiy V Penkov, Mingfeng Li, Said Mikki, et al.Journal of Applied Crystallography|February 7, 2024
ProLEED Studio: software for modeling low-energy electron diffraction patternsPavel Procházka, Jan ČechalJournal of Applied Crystallography|February 7, 2024
An electropneumatic cleaning device for piezo-actuator-driven picolitre-droplet dispensersAlexander Berkes, Stephan Kleine-Doepke, Jan-Philipp Leimkohl, et al.Journal of Applied Crystallography|February 7, 2024
A simple solution to the Rietveld refinement recipe problemB H TobyPageof 112