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Journal of Applied Crystallography|June 17, 2009
AutoSherlock: a program for effective crystallization data analysisRaymond M Nagel, Joseph R Luft, Edward H SnellJournal of Applied Crystallography|June 17, 2009
Combining solution wide-angle X-ray scattering and crystallography: determination of molecular envelope and heavy-atom sitesXinguo Hong, Quan HaoJournal of Applied Crystallography|April 14, 2020
Manual measurement of angles in backscattered and transmission Kikuchi diffraction patternsGert Nolze, Tomasz Tokarski, Grzegorz Cios, et al.Journal of Applied Crystallography|April 14, 2020
In meso crystallogenesis. Compatibility of the lipid cubic phase with the synthetic digitonin analogue, glyco-diosgeninLeendert van Dalsen, Dietmar Weichert, Martin CaffreyJournal of Applied Crystallography|April 14, 2020
PtychoShelves, a versatile high-level framework for high-performance analysis of ptychographic dataKlaus Wakonig, Hans-Christian Stadler, Michal Odstrčil, et al.Journal of Applied Crystallography|October 23, 2019
Recent developments in the Inorganic Crystal Structure Database: theoretical crystal structure data and related featuresD Zagorac, H Müller, S Ruehl, et al.Journal of Applied Crystallography|October 23, 2019
Crystallography at the nanoscale: planar defects in ZnO nanospikesNiklas Wolff, Viktor Hrkac, Jeffrey J Ditto, et al.Journal of Applied Crystallography|October 23, 2019
Diffraction-based determination of single-crystal elastic constants of polycrystalline titanium alloysAlexander Heldmann, Markus Hoelzel, Michael Hofmann, et al.Journal of Applied Crystallography|December 17, 2016
Introduction to the special issue on small-angle scatteringMichael Gradzielski, Andrew J AllenJournal of Applied Crystallography|December 17, 2016
A synchrotron X-ray diffraction deconvolution method for the measurement of residual stress in thermal barrier coatings as a function of depthC Li, S D M Jacques, Y Chen, et al.Pageof 112