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Journal of Applied Crystallography|August 7, 2024
Quantitative selection of sample structures in small-angle scattering using Bayesian methodsYui Hayashi, Shun Katakami, Shigeo Kuwamoto, et al.Journal of Applied Crystallography|December 26, 2022
Updates in SASfit for fitting analytical expressions and numerical models to small-angle scattering patternsJoachim Kohlbrecher, Ingo BreßlerJournal of Applied Crystallography|December 26, 2022
Progressive alignment of crystals: reproducible and efficient assessment of crystal structure similarityAaron J Nessler, Okimasa Okada, Mitchell J Hermon, et al.Journal of Applied Crystallography|December 26, 2022
Automatic bad-pixel mask maker for X-ray pixel detectors with application to serial crystallographyAlireza Sadri, Marjan Hadian-Jazi, Oleksandr Yefanov, et al.Journal of Applied Crystallography|December 26, 2022
Efficient data reduction for time-of-flight neutron scattering experiments on single crystalsAndrei T Savici, Martyn A Gigg, Owen Arnold, et al.Journal of Applied Crystallography|December 26, 2022
Optimization strategies and artifacts of time-involved small-angle neutron scattering experimentsDenis Mettus, Alfonso Chacon, Andreas Bauer, et al.Journal of Applied Crystallography|December 26, 2022
Reconstruction algorithms for grain mapping by laboratory X-ray diffraction contrast tomographyHaixing Fang, Wolfgang Ludwig, Pierre LhuissierJournal of Applied Crystallography|December 26, 2022
Pressure cells for in situ neutron total scattering: time and real-space resolution during deuterium absorptionKazutaka Ikeda, Hidetoshi Ohshita, Toshiya Otomo, et al.Journal of Applied Crystallography|December 14, 2020
Instrumentation and experimental procedures for robust collection of X-ray diffraction data from protein crystals across physiological temperaturesTzanko Doukov, Daniel Herschlag, Filip YabukarskiJournal of Applied Crystallography|December 11, 2020
Unravelling the crystal structure of Nd5.8WO12-δ and Nd5.7W0.75Mo0.25O12-δ mixed ionic electronic conductorsTobias Scherb, Andrea Fantin, Stefano Checchia, et al.Pageof 112