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Journal of Applied Crystallography|September 19, 2013
Enhancement of field-effect mobility due to structural ordering in poly(3-hexylthiophene) films by the dip-coating techniqueKamran Ali, Ullrich Pietsch, Souren GrigorianJournal of Applied Crystallography|September 19, 2013
High-quality quartz single crystals for high-energy-resolution inelastic X-ray scattering analyzersMarcelo Goncalves Hönnicke, Xianrong Huang, Cesar Cusatis, et al.Journal of Applied Crystallography|September 19, 2013
Potential use of V-channel Ge(220) monochromators in X-ray metrology and imagingD Korytár, P Vagovič, K Végsö, et al.Journal of Applied Crystallography|September 19, 2013
A novel small-angle neutron scattering detector geometryKalliopi Kanaki, Andrew Jackson, Richard Hall-Wilton, et al.Journal of Applied Crystallography|November 28, 2013
The interpretation of polycrystalline coherent inelastic neutron scattering from aluminiumDaniel L Roach, D Keith Ross, Julian D Gale, et al.Journal of Applied Crystallography|November 28, 2013
Three-dimensional rotation electron diffraction: software RED for automated data collection and data processingWei Wan, Junliang Sun, Jie Su, et al.Journal of Applied Crystallography|November 28, 2013
Characterization of salt interferences in second-harmonic generation detection of protein crystalsR G Closser, E J Gualtieri, J A Newman, et al.Journal of Applied Crystallography|September 27, 2013
Strain distribution in an Si single crystal measured by interference fringes of X-ray mirage diffractionSukswat Jongsukswat, Tomoe Fukamachi, Dongying Ju, et al.Journal of Applied Crystallography|September 27, 2013
Erratum: A novel small-angle neutron scattering detector geometry. CorrigendumKalliopi Kanaki, Andrew Jackson, Richard Hall-Wilton, et al.Journal of Applied Crystallography|April 19, 2019
Free-film small-angle neutron scattering: a novel container-free in situ sample environment with minimized H/D exchangeSebastian W Krauss, Ralf Schweins, Andreas Magerl, et al.Pageof 112