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Journal of Applied Crystallography|July 21, 2020
Ptychographic X-ray speckle trackingAndrew J Morgan, Harry M Quiney, Saša Bajt, et al.Journal of Applied Crystallography|July 21, 2020
Hydrogen/deuterium exchange behavior in tetragonal hen egg-white lysozyme crystals affected by solution stateAkiko Kita, Yukio MorimotoJournal of Applied Crystallography|August 14, 2020
Dynamical X-ray diffraction imaging of voids in dislocation-free high-purity germanium single crystalsKevin-P Gradwohl, Andreas N Danilewsky, Melissa Roder, et al.Journal of Applied Crystallography|August 14, 2020
Ptychographic X-ray speckle tracking with multi-layer Laue lens systemsAndrew J Morgan, Kevin T Murray, Mauro Prasciolu, et al.Journal of Applied Crystallography|August 14, 2020
MrPIXEL: automated execution of Pixel calculations via the Mercury interfaceMatthew G Reeves, Peter A Wood, Simon ParsonsJournal of Applied Crystallography|April 10, 2023
X-ray scattering study of GaN nanowires grown on Ti/Al2O3 by molecular beam epitaxyVladimir M Kaganer, Oleg V Konovalov, Gabriele Calabrese, et al.Journal of Applied Crystallography|April 10, 2023
Anomalous small-angle X-ray scattering analyses on hierarchical structures of rubber-filler systemsYuki Watanabe, Shotaro Nishitsuji, Mikkihito TakenakaJournal of Applied Crystallography|April 10, 2023
CX-ASAP: a high-throughput tool for the serial refinement and analysis of crystallographic data collected under varying conditionsAmy J Thompson, Kate M L Smith, Jack K Clegg, et al.Journal of Applied Crystallography|April 10, 2023
FAIR and scalable management of small-angle X-ray scattering dataTorsten Giess, Selina Itzigehl, Jan Range, et al.Journal of Applied Crystallography|April 10, 2023
In situ compression of micropillars under coherent X-ray diffraction: a case study of experimental and data-analysis constraintsPierre Godard, Mariana Verezhak, Tarik Sadat, et al.Pageof 112