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Journal of Applied Crystallography|August 25, 2021
GPU-accelerated multitiered iterative phasing algorithm for fluctuation X-ray scatteringPranay Reddy Kommera, Vinay Ramakrishnaiah, Christine Sweeney, et al.
Journal of Applied Crystallography|August 6, 2026
Uncovering hidden bias in neutron diffraction residual strain measurementsCole Franz, Michael Prime, Jeffrey Bunn, et al.
Journal of Applied Crystallography|October 4, 2018
Stacking faults in β-Ga2O3 crystals observed by X-ray topographyHirotaka Yamaguchi, Akito Kuramata
Journal of Applied Crystallography|April 6, 2016
Multigrain indexing of unknown multiphase materialsChristian Wejdemann, Henning Friis Poulsen
Journal of Applied Crystallography|June 7, 2023
Orientation relationships, orientational variants and the embedding approachRichard Arnold, Peter Jupp, Helmut Schaeben
Journal of Applied Crystallography|August 6, 2026
A small-angle scattering model for broad correlation peaks and small diffuse scatteringHenrich Frielinghaus
Journal of Applied Crystallography|February 23, 2011
SoftWAXS: a computational tool for modeling wide-angle X-ray solution scattering from biomoleculesJaydeep Bardhan, Sanghyun Park, Lee Makowski
Journal of Applied Crystallography|August 10, 2016
Measurement and modeling of polarized specular neutron reflectivity in large magnetic fieldsBrian B Maranville, Brian J Kirby, Alexander J Grutter, et al.
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