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Journal of Applied Crystallography|August 9, 2023
Representative volume elements of strain/stress fields measured by diffraction techniquesMehmet Hazar Şeren, Darren C Pagan, Ismail Cevdet NoyanJournal of Applied Crystallography|August 9, 2023
Implication of the double-gating mode in a hybrid photon counting detector for measurements of transient heat conduction in GaAs/AlAs superlattice structuresDenys Naumenko, Max Burian, Benedetta Marmiroli, et al.Journal of Applied Crystallography|August 9, 2023
Small-angle X-ray scattering in the era of fourth-generation light sourcesTheyencheri Narayanan, William Chèvremont, Thomas ZinnJournal of Applied Crystallography|August 9, 2023
Extended Q-range small-angle neutron scattering to understand the morphology of proton-exchange membranes: the case of the functionalized syndiotactic-polystyrene model systemMaria-Maddalena Schiavone, David Hermann Lamparelli, Christophe Daniel, et al.Journal of Applied Crystallography|October 4, 2023
Indium Kα radiation from a MetalJet X-ray source: comparison of the Eiger2 CdTe and Photon III detectorsPaul Niklas Ruth, Nico Graw, Tobias Ernemann, et al.Journal of Applied Crystallography|October 4, 2023
The dependence of X-ray elastic constants with respect to the penetration depthCharles MareauJournal of Applied Crystallography|October 4, 2023
Remote laboratory training for high school students: grocery store based hands-on project in protein crystallographyAli Lillian Fox, Alyssa R Teteris, Irimpan I MathewsJournal of Applied Crystallography|December 5, 2019
FXD-CSD-GUI: a graphical user interface for the X-ray-diffraction-based determination of crystallite size distributionsSigmund H Neher, Helmut Klein, Werner F KuhsJournal of Applied Crystallography|February 13, 2020
The nondestructive measurement of strain distributions in air plasma sprayed thermal barrier coatings as a function of depth from entire Debye-Scherrer ringsChun Li, Ping Xiao, Robert CernikJournal of Applied Crystallography|February 13, 2020
Neutron Larmor diffraction on powder samplesThomas Keller, Piotr Fabrykiewicz, Radosław Przeniosło, et al.Pageof 112