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Journal of Applied Crystallography|December 9, 2014
Tightly integrated single- and multi-crystal data collection strategy calculation and parallelized data processing in JBluIce beamline control systemSudhir Babu Pothineni, Nagarajan Venugopalan, Craig M Ogata, et al.Journal of Applied Crystallography|April 6, 2016
Taking a look at the calibration of a CCD detector with a fiber-optic taperR W Alkire, F J Rotella, N E C Duke, et al.Journal of Applied Crystallography|April 6, 2016
Interlaced X-ray diffraction computed tomographyAntonios Vamvakeros, Simon D M Jacques, Marco Di Michiel, et al.Journal of Applied Crystallography|October 27, 2015
Small-angle neutron scattering correlation functions of bulk magnetic materialsDenis Mettus, Andreas MichelsJournal of Applied Crystallography|October 27, 2015
Profex: a graphical user interface for the Rietveld refinement program BGMNNicola Doebelin, Reinhard KleebergJournal of Applied Crystallography|June 8, 2018
Inverse Transformation: Unleashing Spatially Heterogeneous Dynamics with an Alternative Approach to XPCS Data AnalysisRoss N Andrews, Suresh Narayanan, Fan Zhang, et al.Journal of Applied Crystallography|June 8, 2018
CONTIN XPCS: Software for Inverse Transform Analysis of X-Ray Photon Correlation Spectroscopy DynamicsRoss N Andrews, Suresh Narayanan, Fan Zhang, et al.Journal of Applied Crystallography|October 20, 2021
An electric field cell for performing in situ single-crystal synchrotron X-ray diffractionLucy K Saunders, Hamish H-M Yeung, Mark R Warren, et al.Journal of Applied Crystallography|October 20, 2021
Small-angle neutron scattering from CuCrZr coupons and componentsF Schoofs, S King, A J Cackett, et al.Journal of Applied Crystallography|October 20, 2021
Erratum: Illustrated formalisms for total scattering data: a guide for new practitioners. Corrigendum and addendumPeter F Peterson, David A KeenPageof 112