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Journal of Applied Crystallography|February 14, 2017
CADEM: calculate X-ray diffraction of epitaxial multilayersPaulina Komar, Gerhard Jakob
Journal of Applied Crystallography|December 17, 2016
Atomistic modelling of scattering data in the Collaborative Computational Project for Small Angle Scattering (CCP-SAS)Stephen J Perkins, David W Wright, Hailiang Zhang, et al.
Journal of Applied Crystallography|December 17, 2016
Robust background modelling in DIALSJames M Parkhurst, Graeme Winter, David G Waterman, et al.
Journal of Applied Crystallography|December 17, 2016
SEC-SANS: size exclusion chromatography combined in situ with small-angle neutron scatteringAshley Jordan, Mark Jacques, Catherine Merrick, et al.
Journal of Applied Crystallography|December 17, 2016
Multiparameter characterization of subnanometre Cr/Sc multilayers based on complementary measurementsAnton Haase, Saša Bajt, Philipp Hönicke, et al.
Journal of Applied Crystallography|October 15, 2016
The new NCPSS BL19U2 beamline at the SSRF for small-angle X-ray scattering from biological macromolecules in solutionNa Li, Xiuhong Li, Yuzhu Wang, et al.
Journal of Applied Crystallography|March 4, 2014
The geometry of Niggli reduction: SAUC - search of alternative unit cellsKeith J McGill, Mojgan Asadi, Maria T Karakasheva, et al.
Journal of Applied Crystallography|April 7, 2017
The microstructure of Si surface layers after plasma-immersion He+ ion implantation and subsequent thermal annealingAndrey Lomov, Kirill Shcherbachev, Yurii Chesnokov, et al.
Journal of Applied Crystallography|April 7, 2017
Effect of screw threading dislocations and inverse domain boundaries in GaN on the shape of reciprocal-space mapsMykhailo Barchuk, Mykhaylo Motylenko, Gleb Lukin, et al.
Journal of Applied Crystallography|April 7, 2017
Synchrotron Bragg diffraction imaging characterization of synthetic diamond crystals for optical and electronic power device applicationsThu Nhi Tran Thi, J Morse, D Caliste, et al.
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