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Journal of Applied Crystallography|April 10, 2024
A note on the Hendrickson-Lattman phase probability distribution and its equivalence to the generalized von Mises distributionMichael J Barnett, Richard L KingstonJournal of Applied Crystallography|April 10, 2024
Tripling of the scattering vector range of X-ray reflectivity on liquid surfaces using a double-crystal deflectorOleg Konovalov, Valentina Rein, Mehdi Saedi, et al.Journal of Applied Crystallography|April 10, 2024
Millisecond X-ray reflectometry and neural network analysis: unveiling fast processes in spin coatingDavid Schumi-Mareček, Florian Bertram, Petr Mikulík, et al.Journal of Applied Crystallography|April 10, 2024
X-ray diffraction from dislocation half-loops in epitaxial filmsVladimir M KaganerJournal of Applied Crystallography|January 19, 2026
Revisiting the structures and phase transitions of PrNiO3 nickelate using symmetry-mode analysisWajdi Cherif, José Antonio Alonso, João Elias F S RodriguesJournal of Applied Crystallography|January 19, 2026
Anomalous X-ray diffraction on hybrid perovskite thin films: results and challengesLena Merten, Paul Zimmermann, Niels Scheffczyk, et al.Journal of Applied Crystallography|January 19, 2026
Optimal ratio or historical convention: the use of methanol-ethanol mixtures as pressure-transmitting mediumsCameron J G Wilson, Cecilia M S Alvares, Anna Herlihy, et al.Journal of Applied Crystallography|January 19, 2026
Advancing small-angle X-ray scattering for complex metallic systems: Ti2Cu precipitation in a martensitic near-α Ti alloyDavid Obersteiner, Sabine C Bodner, Helmut Clemens, et al.Journal of Applied Crystallography|January 19, 2026
Structural analysis of co-sputtered Cu-Nb and Cu-Pd textured thin filmsClaudia Cancellieri, Giacomo Lorenzin, Yeliz Unutulmazsoy, et al.Journal of Applied Crystallography|January 19, 2026
X-ray reflectivity from micrometre-scaled surfaces using nanobeamsVedran Vonk, Steffen Tober, Steven J Leake, et al.Pageof 112