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Journal of Applied Crystallography|December 15, 2015
Simultaneous high-resolution scanning Bragg contrast and ptychographic imaging of a single solar cell nanowireJesper Wallentin, Robin N Wilke, Markus Osterhoff, et al.Journal of Applied Crystallography|December 15, 2015
Morphology of crystalline-amorphous olefin block copolymers in solution characterized by small-angle neutron scattering and microscopyAurel Radulescu, Günter Goerigk, Lewis Fetters, et al.Journal of Applied Crystallography|December 15, 2015
The equation of state of the Pmmn phase of NiSiOliver T Lord, Andrew R Thomson, Elizabeth T H Wann, et al.Journal of Applied Crystallography|December 15, 2015
Crystallographic education in the 21st centurySaulius Gražulis, Amy Alexis Sarjeant, Peter Moeck, et al.Journal of Applied Crystallography|December 15, 2015
Logistic regression models to predict solvent accessible residues using sequence- and homology-based qualitative and quantitative descriptors applied to a domain-complete X-ray structure learning setReecha Nepal, Joanna Spencer, Guneet Bhogal, et al.Journal of Applied Crystallography|May 2, 2022
Neural network analysis of neutron and X-ray reflectivity data: automated analysis using mlreflect, experimental errors and feature engineeringAlessandro Greco, Vladimir Starostin, Evelyn Edel, et al.Journal of Applied Crystallography|May 2, 2022
A drug-discovery-oriented non-invasive protocol for protein crystal cryoprotection by dehydration, with application for crystallization screeningDom BelliniJournal of Applied Crystallography|October 13, 2017
Calibrating SANS data for instrument geometry and pixel sensitivity effects: access to an extended Q rangeLukas Karge, Ralph Gilles, Sebastian BuschJournal of Applied Crystallography|October 13, 2017
Erratum: Expanding Lorentz and spectrum corrections to large volumes of reciprocal space for single-crystal time-of-flight neutron diffraction. CorrigendumTara M Michels-Clark, Andrei T Savici, Vickie E Lynch, et al.Journal of Applied Crystallography|February 26, 2019
Optimization of reflectometry experiments using information theoryBradley W Treece, Paul A Kienzle, David P Hoogerheide, et al.Pageof 112