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Journal of Applied Crystallography|February 26, 2019
refnx: neutron and X-ray reflectometry analysis in PythonAndrew R J Nelson, Stuart W PrescottJournal of Applied Crystallography|May 24, 2008
SnB version 2.3: triplet sieve phasing for centrosymmetric structuresHongliang Xu, Alexander B Smith, Nikolaos V Sahinidis, et al.Journal of Applied Crystallography|April 2, 2025
Upgrade of the KWS-2 high-intensity/extended-Q-range SANS diffractometer of JCNS for soft matter and biophysics: in situ SEC, controlled in situ RH/T variation and WANS detectionJia-Jhen Kang, Ralf Biehl, Georg Brandl, et al.Journal of Applied Crystallography|April 2, 2025
Probing the out-of-equilibrium dynamics of driven colloids by X-ray photon correlation spectroscopyTheyencheri Narayanan, William Chèvremont, Thomas ZinnJournal of Applied Crystallography|April 2, 2025
The use of effective core potentials in Hirshfeld atom refinement: making quantum crystallography faster in NoSpherA2Florian Kleemiss, Florian Meurer, Ilya G Shenderovich, et al.Journal of Applied Crystallography|February 6, 2026
Impact of substrate curvature on grazing-incidence small-angle X-ray scattering signal: theory and example of Ag thin-film growthMichał Kamiński, Bärbel Krause, Gregory Abadias, et al.Journal of Applied Crystallography|February 6, 2026
Efficient detection of deformation-induced microstructural modifications in polycrystalline micropillars using scanning X-ray nanodiffractionAnton Davydok, Kritika Singh, Surya Snata Rout, et al.Journal of Applied Crystallography|May 18, 2013
Development and applications of a new neutron single-crystal diffractometer based on a two-dimensional large-area curved position-sensitive detectorChang-Hee Lee, Yukio Noda, Yoshihisa Ishikawa, et al.Journal of Applied Crystallography|April 6, 2012
Constraints and restraints in crystal structure analysisAttilio ImmirziJournal of Applied Crystallography|April 6, 2012
PDB_REDO: automated re-refinement of X-ray structure models in the PDBRobbie P Joosten, Jean Salzemann, Vincent Bloch, et al.Pageof 112