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Journal of Applied Crystallography|April 19, 2019
Global small-angle scattering data analysis of inverted hexagonal phasesMoritz P K Frewein, Michael Rumetshofer, Georg PabstJournal of Applied Crystallography|February 11, 2022
Optimized signal deduction procedure for the MIEZE spectroscopy techniqueJ K Jochum, L Spitz, C Franz, et al.Journal of Applied Crystallography|February 11, 2022
Performance of the time-resolved ultra-small-angle X-ray scattering beamline with the Extremely Brilliant SourceTheyencheri Narayanan, Michael Sztucki, Thomas Zinn, et al.Journal of Applied Crystallography|February 11, 2022
The Euler characteristic as a basis for teaching topology concepts to crystallographersBartosz Naskręcki, Mariusz Jaskolski, Zbigniew DauterJournal of Applied Crystallography|February 11, 2022
Parent grain reconstruction from partially or fully transformed microstructures in MTEXFrank Niessen, Tuomo Nyyssönen, Azdiar A Gazder, et al.Journal of Applied Crystallography|October 21, 2021
reciprocalspaceship: a Python library for crystallographic data analysisJack B Greisman, Kevin M Dalton, Doeke R HekstraJournal of Applied Crystallography|October 21, 2021
New developments including X-ray standing waves in the dynamical Bragg diffraction program of X-ray ServerSergey StepanovJournal of Applied Crystallography|October 4, 2018
Serial electron crystallography for structure determination and phase analysis of nanocrystalline materialsStef Smeets, Xiaodong Zou, Wei WanJournal of Applied Crystallography|October 4, 2018
Glassy carbon, NIST Standard Reference Material (SRM 3600): hydrogen content, neutron vibrational density of states and heat capacityRonald L Cappelletti, Terrence J Udovic, Hui Li, et al.Journal of Applied Crystallography|October 4, 2018
Model-free classification of X-ray scattering signals applied to image segmentationV Lutz-Bueno, C Arboleda, L Leu, et al.Pageof 112