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Journal of Electron Microscopy|August 27, 2005
Reference sample for the evaluation of SEM image resolution at a high magnification--nanometer-scale Au particles on an HOPG substrateShigeo Okayama, Satoshi Haraichi, Hirofumi MatsuhataJournal of Electron Microscopy|August 27, 2005
Electron energy-loss spectroscopy study of ZnO nanobeltsYong Ding, Zhong Lin WangJournal of Electron Microscopy|August 27, 2005
HRTEM imaging of atoms at sub-Angström resolutionMichael A O'Keefe, Lawrence F Allard, Douglas A BlomJournal of Electron Microscopy|February 1, 1992
Location of peptidoglycan and teichoic acid on the cell wall surface of Staphylococcus aureus as determined by immunoelectron microscopyA Umeda, S Yokoyama, T Arizono, et al.Journal of Electron Microscopy|February 1, 1992
A support film of plasma-polymerized naphthalene for electron microscopy: method of preparation and applicationM Yamaguchi, A Tanaka, T SuzukiJournal of Electron Microscopy|October 1, 2005
Evolutionary computation applied to the reconstruction of 3-D surface topography in the SEMTetsuji Kodama, Xiaoyuan Li, Kenji Nakahira, et al.Journal of Electron Microscopy|September 15, 2005
Half-metallic alloys: electronic structure, magnetism and spin polarizationP H Dederichs, I Galanakis, Ph MavropoulosJournal of Electron Microscopy|September 15, 2005
TEM observations of Au and Ir particles supported on CeO2Tomoki Akita, Mitsutaka Okumura, Koji Tanaka, et al.Journal of Electron Microscopy|September 15, 2005
Atomic structures of multi-walled boron nitride nanohornsAtsushi Nishiwaki, Takeo OkuJournal of Electron Microscopy|February 6, 2007
Development of dedicated STEM with high stabilityKoji Kimoto, Kuniyasu Nakamura, Shinji Aizawa, et al.Pageof 116