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Journal of Electron Microscopy|October 12, 2007
Measurement of electron transmission through tilted thick specimens with an ultrahigh voltage electron microscopeHai-Bo Zhang, Fang Wang, Akio TakaokaJournal of Electron Microscopy|June 1, 2010
Coherent electron interference from amorphous TEM specimensRodney A Herring, Koh Saitoh, Nobuo Tanaka, et al.Journal of Electron Microscopy|April 9, 2010
Quantitative backscattered electron imaging of field emission scanning electron microscopy for discrimination of nano-scale elements with nm-order spatial resolutionHyonchol Kim, Tsutomu Negishi, Masato Kudo, et al.Journal of Electron Microscopy|July 21, 2011
Image blurring of thick specimens due to MeV transmission electron scattering: a Monte Carlo studyFang Wang, Hai-Bo Zhang, Meng Cao, et al.Journal of Electron Microscopy|July 27, 2001
New scheme for calculation of annular dark-field STEM image including both elastically diffracted and TDS wavesK Mitsuishi, M Takeguchi, H Yasuda, et al.Journal of Electron Microscopy|May 12, 2001
Discernibility criterion in Fresnel projection microscopyC A Adessi, M DevelJournal of Electron Microscopy|September 15, 2005
Ferromagnetic microstructure in double exchange manganitesS Mori, T Asaka, Y Horibe, et al.Journal of Electron Microscopy|December 7, 2000
Observations of xenon gas-treated barley cells in solution by atomic force microscopyT Yoshino, I Sotome, T Ohtani, et al.Journal of Electron Microscopy|March 29, 2001
Simulation of atomic-scale high-angle annular dark field scanning transmission electron microscopy imagesT Yamazaki, K Watanabe, A Recnik, et al.Journal of Electron Microscopy|May 14, 2003
Applications of 1 MV field-emission transmission electron microscopeAkira TonomuraPageof 116