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Journal of Electron Microscopy|July 13, 2002
Measurement of mean free paths for inelastic electron scattering of Si and SiO2Chang-Woo Lee, Yoichi Ikematsu, Daisuke Shindo
Journal of Electron Microscopy|January 17, 2002
Nano-area electron diffraction pattern reconstructed from three-dimensional Fourier spectrumT Kawasaki, Y Takai, T Ikuta, et al.
Journal of Electron Microscopy|June 8, 2004
Detection of iron-oxide layer on the surface of iron nitride using high-resolution electron microscopy and Fourier filteringZhi-Quan Liu, Minghui Song, Kazutaka Mitsuishi, et al.
Journal of Electron Microscopy|May 10, 2008
Imaging the interaction between dengue 2 virus and human blood platelets using atomic force and electron microscopyKanjaksha Ghosh, Shobha Gangodkar, Preksha Jain, et al.
Journal of Electron Microscopy|October 15, 2009
Dimethylthiourea pretreatment inhibits endotoxin-induced compound exocytosis in goblet cells and plasma leakage of rat small intestineShang-Pin Liu, Chien-Yu Chang, Wen-Hung Huang, et al.
Journal of Electron Microscopy|March 7, 2008
The development and characteristics of a high-speed EELS mapping system for a dedicated STEMShigeto Isakozawa, Kazutoshi Kaji, Konrad Jarausch, et al.
Journal of Electron Microscopy|October 1, 1996
Phenotypic characteristics and significance of reticular meshwork surrounding splenic white pulp of miceH Tanaka, Y Hataba, S Saito, et al.
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