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Journal of Electron Microscopy|January 17, 2002
Electrostatic correction of the chromatic and of the spherical aberration of charged-particle lenses (part I)C Weissbäcker, H RoseJournal of Electron Microscopy|January 17, 2002
Fourier analysis of HRTEM image deterioration caused by mechanical vibrationT Kawasaki, Y Kimura, Y Takai, et al.Journal of Electron Microscopy|December 7, 2000
Atomic force microscopy in structural biology: from the subcellular to the submolecularD M Czajkowsky, H Iwamoto, Z ShaoJournal of Electron Microscopy|December 7, 2000
Atomic force microscopy proposes a 'kiss and pull' mechanism for enhancer function. offS H Yoshimura, C Yoshida, K Igarashi, et al.Journal of Electron Microscopy|December 7, 2000
Atomic force microscopy with carbon nanotube probe resolves the subunit organization of protein complexesK I Hohmura, Y Itokazu, S H Yoshimura, et al.Journal of Electron Microscopy|December 7, 2000
The application of the atomic force microscope to studies of medically important protozoan parasitesJ A Dvorak, S Kobayashi, K Abe, et al.Journal of Electron Microscopy|December 7, 2000
Deformation of the envelope of a spherical gram-negative bacterium during the atomic force microscopic measurementsA BoulbitchJournal of Electron Microscopy|December 7, 2000
Atomic resolution Z-contrast imaging of semiconductorsXin, James, Browning, et al.Journal of Electron Microscopy|December 7, 2000
Direct observation of piezoelectric fields in GaN/ InGaN/GaN strained quantum wellsBarnard, ChernsJournal of Electron Microscopy|December 7, 2000
Dislocation propagation in GaN films formed by epitaxial lateral overgrowthSakai, Sunakawa, Kimura, et al.Pageof 116