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Journal of Electron Microscopy Technique|July 1, 1989
Study of temperature factors in cubic crystals by high-voltage electron diffractionS Matsumura, Y Tomokiyo, K OkiJournal of Electron Microscopy Technique|July 1, 1989
High-resolution transmission electron microscopy of inorganic materials in cellular and topological random systemsM Shiojiri, Y Hirota, T Isshiki, et al.Journal of Electron Microscopy Technique|October 1, 1989
Convergent beam diffraction studies of interfaces, defects, and multilayersD Cherns, A R PrestonJournal of Electron Microscopy Technique|December 1, 1989
Ultrathin (1 nm) vertically shadowed platinum-carbon replicas for imaging individual molecules in freeze-etched biological DNA and material science metal and plastic specimensG C RubenJournal of Electron Microscopy Technique|January 1, 1990
Moiré fringe analysis of small precipitates in melt-spun titanium-silicon alloysL S Chumbley, H L FraserJournal of Electron Microscopy Technique|June 1, 1991
Loss of grain boundary segregant during ion millingE A KenikJournal of Electron Microscopy Technique|September 1, 1988
High-resolution electron microscopic investigation of supported platinum particles reduced at high temperaturesL Wang, G W Qiao, H Q Ye, et al.Journal of Electron Microscopy Technique|April 1, 1991
Polarity of the surface and cortex of the amphibian egg from fertilization to first cleavageJ Stewart-Savage, R D Grey, R P ElinsonJournal of Electron Microscopy Technique|February 1, 1991
Extending the limit of atomic level grain boundary structure imaging using high-resolution electron microscopyW KrakowPageof 42