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Journal of Imaging|April 27, 2026
Wafer Defect Recognition for Industrial Inspection: FCS-VMamba Model and Experimental ValidationYijia Zhang, Ziyi Ma, Tongji Cui, et al.
Journal of Imaging|July 27, 2026
Benchmarking Barren Plateau Mitigation Strategies in Quantum Neural Networks on Standard and Medical Image DatasetsMaqsudur Rahman, Rui Liu, Anup Majumder, et al.
Journal of Imaging|July 27, 2026
An Adaptive Attention-Driven Quadruplet Deep Hashing Method for Retrieving Histopathological ImagesSeyed Mohammad Alizadeh, Henning Müller, Mohammad Sadegh Helfroush
Journal of Imaging|August 30, 2021
Tip Crack Imaging on Transparent Materials by Digital Holographic MicroscopyWen-Jing Zhou, Bo-Yu Li, Hong-Xia Shen, et al.
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