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Journal of Microscopy|August 13, 2010
Confined displacement algorithm determines true and random colocalization in fluorescence microscopyO Ramírez, A García, R Rojas, et al.Journal of Microscopy|August 13, 2010
Photometric calibration for quantitative spectral microscopy under transmitted illuminationJ Thigpen, F A Merchant, S K ShahJournal of Microscopy|August 13, 2010
Scintillation SE detector for variable pressure scanning electron microscopesJ Jirák, V Nedela, P Cernoch, et al.Journal of Microscopy|August 13, 2010
Electron back-scattering diffraction (EBSD) measurements of antigorite lattice-preferred orientations (LPO)B van de Moortèle, L Bezacier, G Trullenque, et al.Journal of Microscopy|November 6, 2010
3D visualization of subcellular structures of Schizosaccharomyces pombe by hard X-ray tomographyY Yang, W Li, G Liu, et al.Journal of Microscopy|November 6, 2010
Mach-Zehnder interference microscopy optically records electrically stimulated cellular activity in unstained nerve cellsR A Kaul, D M Mahlmann, P LoosenJournal of Microscopy|December 16, 2010
Improvements in planar feature reconstructions in atom probe tomographyD J Larson, B P Geiser, T J Prosa, et al.Journal of Microscopy|December 16, 2010
Fibre-top atomic force microscope probe with optical near-field detection capabilitiesB Tiribilli, G Margheri, P Baschieri, et al.Journal of Microscopy|November 17, 2010
The use of laser scanning confocal microscopy (LSCM) in materials scienceD B Hovis, A H HeuerPageof 485