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Journal of Microscopy|November 17, 2010
The use of laser scanning confocal microscopy (LSCM) in materials scienceD B Hovis, A H Heuer
Journal of Microscopy|November 17, 2010
Noise effects and filtering in controlled light exposure microscopyR A Hoebe, C J F van Noorden, E M M Manders
Journal of Microscopy|November 17, 2010
Effect of gallium focused ion beam milling on preparation of aluminium thin foilsK A Unocic, M J Mills, G S Daehn
Journal of Microscopy|January 1, 1990
Probing DNA structure and function with a multi-wavelength fluorescence confocal laser microscopeD J Arndt-Jovin, M Robert-Nicoud, T M Jovin
Journal of Microscopy|December 17, 2010
The semi-automatic nucleatorL V Hansen, J R Nyengaard, J B Andersen, et al.
Journal of Microscopy|December 4, 2010
Focussed ion beam milling at grazing incidence anglesJ Hazekamp, S Doherty, A Elsaesser, et al.
Journal of Microscopy|March 8, 2011
A simple tool for stereological assessment of digital images: the STEPanizerS A Tschanz, P H Burri, E R Weibel
Journal of Microscopy|February 18, 2011
Application of regularized Richardson-Lucy algorithm for deconvolution of confocal microscopy imagesM Laasmaa, M Vendelin, P Peterson
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