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Journal of Microscopy|August 25, 1999
Quantitative metallography by electron backscattered diffractionHumphreys
Journal of Microscopy|August 25, 1999
Influence of grain orientations on the initiation of fatigue damage in an Al-Li alloyTaylor, Zhai, Wilkinson, et al.
Journal of Microscopy|January 29, 2000
Multiple frequency fluorescence lifetime imaging microscopyA Squire, P J Verveer, P I Bastiaens
Journal of Microscopy|December 14, 1999
The shape of field emitters and the ion trajectories in three-dimensional atom probesVurpillot, Bostel, Blavette
Journal of Microscopy|January 5, 2000
Analysis of integrin (CD11b/CD18) movement during neutrophil adhesion and migration on endothelial cellsY P Rochon, T J Kavanagh, J M Harlan
Journal of Microscopy|January 5, 2000
Optimizing the window size for multiple least squares fitting of electron energy loss spectraR Ho, J Feng, A P Somlyo, et al.
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