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Journal of Microscopy|July 31, 2003
Correction of autofocusing errors due to specimen tilt for automated electron tomographyU Ziese, W J C Geerts, T P Van Der Krift, et al.Journal of Microscopy|July 31, 2003
Wavelet-based image restoration for compact X-ray microscopyH Stollberg, J Boutet de Monvel, A Holmberg, et al.Journal of Microscopy|July 4, 2003
Variable-angle total internal reflection fluorescence microscopy (VA-TIRFM): realization and application of a compact illumination deviceK Stock, R Sailer, W S L Strauss, et al.Journal of Microscopy|July 4, 2003
Semi-automated software for the three-dimensional delineation of complex vascular networksP R Barber, B Vojnovic, S M Ameer-Beg, et al.Journal of Microscopy|July 4, 2003
On the estimation variance for the specific Euler-Poincaré characteristic of random networksA Tscheschel, D StoyanJournal of Microscopy|July 4, 2003
Measurement of the electric field distribution and potentials on the object surface in an emission electron microscope without restriction of the electron beamsS A Nepijko, A Gloskovskii, N N Sedov, et al.Journal of Microscopy|February 6, 2019
Applications of reflection-contrast microscopy, including the sensitive detection of the results of in situ hybridisation a reviewJohan PloemJournal of Microscopy|December 20, 2019
Comparison of xenon and gallium sources on the detection and mapping of lithium in Li-containing materials by using ToF-SIMS combined FIB-SEMK B Dermenci, H Tesařová, T Šamořil, et al.Journal of Microscopy|November 23, 2019
The importance of being edgy: cell geometric edges as an emerging polar domain in plant cellsL Elliott, C KirchhelleJournal of Microscopy|February 20, 2020
Multiphoton intravital microscopy in small animals: motion artefact challenges and technical solutionsD Soulet, J Lamontagne-Proulx, B Aubé, et al.Pageof 486