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Journal of Microscopy|February 18, 2009
Microwave-assisted rapid plant sample preparation for transmission electron microscopyB Zechmann, G Zellnig
Journal of Microscopy|February 18, 2009
Accuracy assessment of elastic strain measurement by EBSDS Villert, C Maurice, C Wyon, et al.
Journal of Microscopy|February 18, 2009
Adaptive watershed segmentation of binary particle imageH Q Sun, Y J Luo
Journal of Microscopy|February 18, 2009
Self-calibration method for vision-guided cell micromanipulation systemsY L Zhang, M L Han, C Y Shee, et al.
Journal of Microscopy|September 17, 2009
Photooxidation technology for correlated light and electron microscopyC Meisslitzer-Ruppitsch, C Röhrl, J Neumüller, et al.
Journal of Microscopy|September 24, 2009
A compact STED microscope providing 3D nanoscale resolutionD Wildanger, R Medda, L Kastrup, et al.
Journal of Microscopy|September 24, 2009
Estimation of variance components of local stereological volume estimators: a pilot studyZ Pawlas, J R Nyengaard
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