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Journal of Microscopy|March 3, 2009
Combined EBSD/EDS tomography in a dual-beam FIB/FEG-SEMG D West, R C Thomson
Journal of Microscopy|June 5, 2009
Improvement to the scanning electron microscope image colorization by adaptive tuningK S Sim, H Y Ting, M A Lai, et al.
Journal of Microscopy|June 5, 2009
Two-stage focus-hold system for rapid ultra-sensitive read-out of large-area biochipsC Hesch, J Hesse, J Jacak, et al.
Journal of Microscopy|June 5, 2009
Can the Nomura lens be free of spherical aberration?P W Hawkes
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