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Journal of Microscopy|March 12, 2008
Characteristics of light intensity enhancement of a silver nanoprism with rounded cornersK Yamaguchi, T Inoue, M Fujii, et al.Journal of Microscopy|November 13, 2018
Influence of the crosstalk on the intensity of HAADF-STEM images of quaternary semiconductor materialsN Baladés, M Herrera, D L Sales, et al.Journal of Microscopy|October 25, 2018
Relationship between the anisotropy tensor calculated through global and object measurements in high-resolution X-ray tomography on cellular and composite materialsF DE Pascalis, M NacucchiJournal of Microscopy|May 1, 1988
Classification of images of biomolecular assemblies: a study of ribosomes and ribosomal subunits of Escherichia coliJ Frank, J P Bretaudiere, J M Carazo, et al.Journal of Microscopy|February 21, 2017
Characterization of the μ and P phase precipitates in the CMSX-4 single crystal superalloyB Dubiel, P Indyka, T Moskalewicz, et al.Journal of Microscopy|February 21, 2017
Determination of a homogeneity factor for composite materials by a microstructural image analysis methodGunes A Yakaboylu, Edward M SabolskyJournal of Microscopy|March 16, 2017
Unifying miscellaneous performance criteria for a prototype supercapacitor via Co(OH)2 active material and current collector interactionsH X Wang, W Zhang, N E Drewett, et al.Journal of Microscopy|March 16, 2017
Crystalline phases found in rapidly quenched Ni-Nb-Zr alloysL P Deo, M J Kaufman, B Wang, et al.Journal of Microscopy|March 16, 2017
Investigation of fatigue crack initiation facets in Ti-6Al-4V using focused ion beam milling and electron backscatter diffractionJ Everaerts, B Verlinden, M WeversJournal of Microscopy|March 16, 2017
Multidie LED combined with homogenizing optics to improve frequency response and intensity for FLIM applicationsH-T Liu, W-L Lin, Y-L Feng, et al.Pageof 486