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Journal of Microscopy|July 31, 2003
A simple approach to the determination of the crystallographic orientation: applications and accuracyS C Wang, M J StarinkJournal of Microscopy|July 4, 2003
Near-field scanning optical microscopy probes: a comparison of pulled and double-etched bent NSOM probes for fluorescence imaging of biological samplesP Burgos, Z Lu, A Ianoul, et al.Journal of Microscopy|July 4, 2003
Attenuation correction in confocal laser microscopes: a novel two-view approachA Can, O Al-Kofahi, S Lasek, et al.Journal of Microscopy|December 16, 2010
Low-energy electron scattering in carbon-based materials analyzed by scanning transmission electron microscopy and its application to sample thickness determinationM Pfaff, E Müller, M F G Klein, et al.Journal of Microscopy|October 16, 2010
Nanomechanical characterization of skin and skin creamB Bhushan, W Tang, S GeJournal of Microscopy|December 2, 2010
Region-of-interest tomography using filtered backprojection: assessing the practical limitsA Kyrieleis, V Titarenko, M Ibison, et al.Journal of Microscopy|December 2, 2010
Real-time enzymatic degradation of human dentin collagen fibrils exposed to exogenous collagenase: an AFM study in situX Zheng, H Pan, Z Wang, et al.Journal of Microscopy|December 2, 2010
3D deconvolution of spherically aberrated images using commercial softwareM A Model, J Fang, P Yuvaraj, et al.Journal of Microscopy|December 2, 2010
A multiscale microstructure model of carbon black distribution in rubberA Jean, D Jeulin, S Forest, et al.Journal of Microscopy|December 2, 2010
Sub-nanometre elemental analysis of Cu cluster in Fe-Cu-Ni alloy using aberration corrected STEM-EDSH Nakamichi, K Yamada, K SatoPageof 486