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Journal of Microscopy|May 27, 2010
Electron detection in the intermediate chamber of the variable pressure SEMW Slówko, M KrysztofJournal of Microscopy|May 27, 2010
Microstructure and high temperature transport properties of Ca-doped nickel oxideL Cieniek, J Kusiński, G Petot-Ervas, et al.Journal of Microscopy|May 27, 2010
TEM characterization of MBE grown CdTe/ZnTe axial nanowiresP Dłuzewski, E Janik, S Kret, et al.Journal of Microscopy|May 27, 2010
Transmission electron microscopy characterization of Au/Pt/Ti/Pt/GaAs ohmic contacts for high power GaAs/InGaAs semiconductor lasersA Łaszcz, A Czerwinski, J Ratajczak, et al.Journal of Microscopy|May 27, 2010
Surface morphology of unalloyed steels remelted with intense plasma pulsesB Sartowska, J Piekoszewski, L Waliś, et al.Journal of Microscopy|May 27, 2010
Transmission electron microscopy study of erbium silicide formation from Ti/Er stack for Schottky contact applicationsJ Ratajczak, A Łaszcz, A Czerwinski, et al.Journal of Microscopy|May 27, 2010
Structural and chemical composition studies of pulsed laser deposited beta-Al-Mg thin filmsA RadziszewskaJournal of Microscopy|May 27, 2010
Structural characterization of nano-sized Ce 0.5 Ln 0.5 O 1.75 (Ln = Yb, Lu) mixed oxidesM A Małecka, L KepińskiJournal of Microscopy|May 27, 2010
The chemical phenol extraction of intermetallic particles from casting AlSi5Cu1Mg alloyG Mrówka-Nowotnik, J Sieniawski, A NowotnikJournal of Microscopy|May 27, 2010
Degradation of the TBC system during the static oxidation testG Moskal, L Swadźba, B Mendala, et al.Pageof 486