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Journal of Microscopy|August 12, 1999
I5M: 3D widefield light microscopy with better than 100 nm axial resolutionM G Gustafsson, D A Agard, J W Sedat
Journal of Microscopy|August 12, 1999
Quantitative electron spectroscopic diffraction analyses of the crystal formation in dentineS Arnold, U Plate, H P Wiesmann, et al.
Journal of Microscopy|February 24, 2001
Thermal imaging of compositesD. P. Almond, W. Peng
Journal of Microscopy|February 24, 2001
Microstructural analysis of a FeAl/quasicrystal-based composite prepared using a focused ion beam millerJ. M. Cairney, P. R. Munroe, D. J. Sordelet
Journal of Microscopy|February 24, 2001
Microcracking mechanism in a SiCf-SiBC composite creep-tested in argonS. Darzens, J. L. Chermant, J. Vicens
Journal of Microscopy|February 24, 2001
Subsurface nanoindentation deformation of Cu-Al multilayers mapped in 3D by focused ion beam microscopyB. J. Inkson, T. Steer, G. Möbus, et al.
Journal of Microscopy|February 24, 2001
Transmission electron microscopy studies of squeeze cast Al-AlN compositesM. Chédru, J. Vicens, J. L. Chermant, et al.
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