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Journal of Microscopy|July 15, 2015
Experimental evaluation of environmental scanning electron microscopes at high chamber pressureH Fitzek, H Schroettner, J Wagner, et al.
Journal of Microscopy|January 10, 2018
An optical configuration for fastidious STEM detector calibration and the effect of the objective-lens pre-fieldL Jones, A Varambhia, H Sawada, et al.
Journal of Microscopy|January 16, 2018
A guide to analysis and reconstruction of serial block face scanning electron microscopy dataE Cocks, M Taggart, F C Rind, et al.
Journal of Microscopy|January 26, 2018
Spectroscopic identification of individual fluorophores using photoluminescence excitation spectraJ Czerski, W Colomb, F Cannataro, et al.
Journal of Microscopy|March 31, 2018
Recent research on stimulated emission depletion microscopy for reducing photobleachingC Li, S Liu, W Wang, et al.
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