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Journal of Microscopy|October 20, 2022
Advancement and challenges in sample preparation for atomic force microscopy and infrared microscopy for wood-based materialsElisabeth Anna Schoeffmann, Arunjunai Raj Mahendran, Edith Zikulnig-Rusch, et al.Journal of Microscopy|October 17, 2022
Quantitative analysis of backscattered-electron contrast in scanning electron microscopyMartin Čalkovský, Erich Müller, Dagmar GerthsenJournal of Microscopy|August 1, 1978
Critical point drying for scanning electron microscopy: a semi-automatic method of preparing biological specimensD J Hall, E J Skerrett, W D ThomasJournal of Microscopy|September 1, 1978
A simple method for maintaining relative positions of separate tissue elements during processing for electron microscopyC A StirlingJournal of Microscopy|September 1, 1978
Area changes in slices of rat brain during preparation for histology or electron microscopyH Hillman, K DeutschJournal of Microscopy|October 7, 2022
Measuring the randomness of micro- and nanostructure spatial distributions: Effects of scanning electron microscope image processing and analysisA Mavrogonatos, E-M Papia, P Dimitrakellis, et al.Journal of Microscopy|June 3, 2011
Geometrical characterization of interconnected phase networks in three dimensionsP S Jørgensen, K V Hansen, R Larsen, et al.Journal of Microscopy|May 5, 2011
AnyStitch: a tool for combining electron backscatter diffraction data setsA L Pilchak, A R Shiveley, J S Tiley, et al.Journal of Microscopy|July 16, 2011
Experiments and quantitative analysis of frequency division multiplexing confocal fluorescence microscopy with UV excitationJ Zheng, Y Jiang, Y Zhang, et al.Journal of Microscopy|July 23, 2011
A simple introduction to multiphoton microscopyA Ustione, D W PistonPageof 486