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Journal of Microscopy|September 1, 1993
Standards for quantification of elements in the otolithic membrane by electron probe X-ray microanalysis: calibration curves and electron beam sensitivityJ A López-Escámez, P V Crespo, F J Cañizares, et al.Journal of Microscopy|January 9, 2010
Controlled dehydration of a biological sample using an alternative form of environmental SEMV NedĕlaJournal of Microscopy|January 9, 2010
Time-lapse FRET microscopy using fluorescence anisotropyD R Matthews, L M Carlin, E Ofo, et al.Journal of Microscopy|January 26, 2010
High-resolution wide-field microscopy with adaptive optics for spherical aberration correction and motionless focusingP Kner, J W Sedat, D A Agard, et al.Journal of Microscopy|January 26, 2010
Electron tomography of III-V quantum dots using dark field 002 imaging conditionsR Beanland, A M Sánchez, J C Hernandez-Garrido, et al.Journal of Microscopy|January 26, 2010
Computation of a tetrahedral mesh for striated muscle deformation simulationA R Zaher, F Weichert, N Bramsiepe, et al.Journal of Microscopy|May 5, 2017
Observation of asphalt binder microstructure with ESEMP Mikhailenko, H Kadhim, H Baaj, et al.Journal of Microscopy|September 21, 2016
Bayesian model for detection and classification of meningioma nuclei in microscopic imagesO Wirjadi, Y-J Kim, F Stech, et al.Journal of Microscopy|July 7, 2017
Direct observations of dynamic PtCo interactions in fuel cell catalyst precursors at the atomic level using E(S)TEMM R Ward, B Theobald, J Sharman, et al.Journal of Microscopy|July 8, 2017
A reliable approach to prepare brittle semiconducting materials for cross-sectional transmission electron microscopyJ H Dycus, J M LebeauPageof 486