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Journal of Microscopy|November 25, 2016
The benefit of thresholding carbon layers in electron tomographic tilt series by intensity downshiftingLionel C Gontard, Jesús Cintas, Rafal E Dunin Borkowski
Journal of Microscopy|May 8, 2014
Nonlinear optical microscopy with vibrational contrastM J Winterhalder, A Zumbusch
Journal of Microscopy|April 4, 2017
A protocol for registration and correction of multicolour STED superresolution imagesE Hebisch, E Wagner, V Westphal, et al.
Journal of Microscopy|March 22, 2014
Backscattered electron SEM imaging of cells and determination of the information depthJ Seiter, E Müller, H Blank, et al.
Journal of Microscopy|March 27, 2014
Analysis of asphaltic binders modified with PPA by surface techniquesErico R Dourado, Bianca S Pizzorno, Laura M G Motta, et al.
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