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Journal of Microscopy|February 29, 2008
Probing surface plasmon fields by far-field Raman imagingG Laurent, N Félidj, J Grand, et al.Journal of Microscopy|February 29, 2008
Broadband optical near-field microscope for nanoscale absorption spectroscopy of organic materialsR Pomraenke, C Ropers, J Renard, et al.Journal of Microscopy|February 29, 2008
Stress imagining of semiconductor surface by tip-enhanced Raman spectroscopyY Saito, M Motohashi, N Hayazawa, et al.Journal of Microscopy|February 29, 2008
SNOM signal near plasmonic nanostructures: an analogy with fluorescence decays channelsG Colas des Francs, C Girard, A Bruyant, et al.Journal of Microscopy|February 29, 2008
A novel approach to detect and characterize the scattering patterns of single Au nanoparticles using confocal microscopyT Züchner, A V Failla, A Hartschuh, et al.Journal of Microscopy|October 10, 1998
Ultrathin fluorescent layers for monitoring the axial resolution in confocal and two-photon fluorescence microscopySchrader, Hofmann, HellJournal of Microscopy|October 10, 1998
Dispersion pre-compensation of 15 femtosecond optical pulses for high-numerical-aperture objectivesMüller, Squier, Wolleschensky, et al.Journal of Microscopy|October 10, 1998
Estimation of average particle size from vertical projectionsGokhale, BenesJournal of Microscopy|October 10, 1998
Star length distribution: a volume-based concept for the characterization of structural anisotropySmit, Schneider, OdgaardPageof 483